Book Chapters:

• S. Falas, C. Konstantinou, and M. K. Michael (2020), “Hardware-Enabled Secure Firmware Updates in Embedded Systems”. In Metzler C., Gaillardon PE., De Micheli G., Silva-Cardenas C., Reis R. (eds) VLSI-SoC: New Technology Enabler (pp 165-185). VLSI-SoC 2019. IFIP Advances in Information and Communication Technology, vol 586. Springer, Cham.
• M. Skitsas, Marco Restifo, M. K. Michael, C. Nicopoulos, P. Bernardi, E. Sanchez (2018), “Self Testing of Multicore Processors”, in Bashir Al-Hashimi and Geoff Merrett (Ed.), Many Core Computing: Hardware and Software (pp. 1-30), June 2019, The Institution of Engineering and Technology (IET), e-ISBN: 9781785615832, Chapter DOI: 10.1049/PBPC022E_ch
• C. Bolchini, M. K. Michael, A. Miele, S. Neophytou (2017) “Dependability Threats”, in M. Ottavi, S. Pontarelli, D. Gizopoulos (Ed.), Dependable Multicore Architectures at Nanoscale (pp. 1-35), 1st Ed., July 2017, Springer, ISBN-13: 9783319544212.

Refereed Archival Journal Articles:

Refereed Conferences, Symposia & Workshops with Proceedings

• G. L. Stavrinides, M. K. Michael, T. Theocharides, “Optimal Multi-Constrained Workflow Scheduling in the Edge-Cloud Continuum”, 48^th IEEE International Conference on Computers, Software, and Applications, July 2024, Osaka, Japan, pp. 1-10.
• M. Asprou, C. Konstantinou and M. K. Michael, “Physics-Informed Neural Networks for Accelerating Power System State Estimation”, IEEE PES Innovative Smart Grid Technologies Europe (ISGT-Europe), October 2023, Grenoble, France, pp. 1-5.
• , L. Hadjidemetriou, C. Laoudias and M. K. Michael, “Modelling and Analysing Security Threats Targeting Protective Relay Operations in Digital Substations”, IEEE Cyber Security and Resilience Conference (CSR), July 2023, Venice, Italy, pp. 1-7.
• S. Datta, P. Nicolaou and M. K. Michael, “Reputation-based User Vehicle Assignment in Intelligent and Connected Vehicle Platoons”, IEEE International Conference on Omni-layer Intelligent Systems (COINS), August 2023, Berlin, Germany, pp. 1-7.
• N. Piperigkos, C. Anagnostopoulos, A. Lalos, S. Z. Zukhraf, Christos Laoudias, M. K. Michael, “Robust Cooperative Sparse Representation Solutions for Detecting and Mitigating Spoofing Attacks in Autonomous Vehicles”, IEEE Mediterranean Conference on Control and Automation (MED2023), June 2023, Limassol, Cyprus, pp. 1-6.
• S. Filippou, A. Achilleos, S. Z. Zukhraf, C. Laoudias, K. Malialis, M. K. Michael and G. Ellinas, “Machine Learning Approach for Detecting GPS Location Spoofing Attacks in Autonomous Vehicles”, IEEE Vehicular Technology Conference (VTC2023-Spring), June 2023, Florance, Italy, pp. 1-7.
• M. F. Elrawy, E. Tekki, L. Hadjidemetriou, C. Laoudias and M. K. Michael, “Protection and Communication Model of Intelligent Electronic Devices to Investigate Security Threats”, IEEE PES Innovative Smart Grid Technologies NA (ISGT-NA), January 2023, Washington-DC, USA, pp. 1-5.
• P. Nicolaou, Y. Sazeides and M. K. Michael, “INTERPLAY: An Intelligent Model for Predicting Performance Degradation due to Multi-cache Way-disabling”, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS2022), October 2022, Austin-Texas, USA, pp. 1-6.
• A. Kritikakou, P. Nikolaou, I. Rodriguez-Ferrandez, J. Paturel, L. Kosmidis, M. K. Michael, O. Sentieys and D. Steenari, “Functional and Timing Implications of Transient Faults in Critical Systems”, IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), September 2022, Turin, Italy, pp. 1-10.
• K. Aslansefat, P. Nikolaou, M. Walker, M. N. Akram, I. Sorokos, J. Reich, P. Kolios, M. K. Michael, T. Theocharides, G. Ellinas, D. Schneider and Y. Papadopoulos, “SafeDrones: Real-Time Reliability Evaluation of UAVs using Executable Digital Dependable Identities”, International Symposium on Model-Based Safety and Assessment (IMBSA2022), September 2022, Munich, Germany, pp. 1-15.
• G. Tertytchny and M. K. Michael, “Two-dimensional Dataset Reduction in Data-Driven Fault Detection for IoT-based Cyber Physical Systems”, IEEE International Conference on Omni-layer Intelligent Systems (COINS), August 2022, Barcelona, Spain, pp. 1-6.
• M. F. Elrawy, L. Hadjidemetriou, C. Laoudias and M. K. Michael, “Light-weight and Robust Network Intrusion Detection for Cyber-attacks in Digital Substations”, IEEE PES Innovative Smart Grid Technologies Asia (ISGT Asia), December 2021, Brisbane, Australia, pp. 1-5.
• P. Corneliou, P. Nikolaou, M. K Michael, T. Theocharides, “Fine-Grained Vulnerability Analysis of Resource Constrained Neural Inference Accelerators”, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), October 2021, Athens, Greece, pp. 1-6.
• L. Stylianou, L. Hadjidemetriou, M. Asprou, L. Zacharia and M. K. Michael, “A behavioral model to detect data manipulation attacks of synchrophasor measurements”, IEEE PES Innovative Smart Grid Technologies Europe (ISGT Europe), October 2021, Espoo, Finland, pp. 1-6.
• S. Datta, P. Nicolaou and M. K. Michael, “TrustPH: Trustworthy Platoon Head Selection considering Cognitive Biases to enhance Secure Platooning in Intelligent and Connected Vehicles”, IEEE International Conference on Intelligent Transportation (ITSC), September 2021, Indianapolis, USA, pp. 1-8.
• R. Solomou, G. Savva, M. Mavrovouniotis, G. Ellinas, M. Michael, G. Spyrou and C. Pitris, “Exploring a disease network using random walks with bibliometric assessment to reveal potential disease-related pathways”, IEEE-EMBS International Conference on Biomedical and Health Informatics (BHI’21), July 2021, (extended abstract).
• S. Falas, C. Konstantiou and M. K. Michael, “Physics-Informed Neural Networks for Securing Water Distribution Systems”, 38th IEEE International Conference on Computer Design (ICCD), October 2020, Hartford, CT, USA, pp. 37-40 [invited referred paper].
• L. Hadjidemetriou, G. Tertytchny, H. Karbouj, C. Charalambous, M. K. Michael, M. Sazos and M. Maniatakos, “Demonstration of Man in the Middle Attack on a Feeder Power Factor Correction Unit”, IEEE PES Innovative Smart Grid Technologies Europe (iSGT-Europe), October 2020, Hague, Belgium, pp. 126-130.
• G. Tertytchny, H. Karbouj, L. Hadjidemetriou, C. Charalambous, M. K. Michael, M. Sazos and M. Maniatakos, “Demonstration of Man in the Middle Attack on a Commercial Photovoltaic Inverter Providing Ancillary Services”, IEEE Cybersecurity of Power Electronics Systems (CyberPELS), co-located with ΙΕΕΕ Energy Conversion Congress & Expo (ECCE), October 2020, Miami, FL, USA, pp. 1-7, doi: 10.1109/CyberPELS49534.2020.9311531.
• S. Viktoros, M. K. Michael, M. Polycarpou, “Compact Fault Dictionaries for Efficient Sensor Fault Diagnosis in IoT-enabled CPSs”, IEEE SmartIoT Conference, August 2020, Beijing, China, pp. 236-243.
• G.  Tertytchny and M. K. Michael, “Dataset Reduction Framework For Intelligent Fault Detection In IoT- based Cyber-Physical Systems Using Machine Learning Techniques”, IEEE International Conference on Omni-layer Intelligent Systems (COINS), August 2020, Barcelona, Spain, pp. 1-6.
• K. Jaskie, S. Rao, W. Barnard, E. Kyriakides, I. Tofis, L. Hadjidemetriou, M. K. Michael, and A. Spanias, “IRES Program in Sensors and Machine Learning for Energy Systems”, IEEE International Conference on Information, Intelligence, Systems and Applications (IISA), July 2020, Athens, Greece, pp. 1-5 [recipient of Best Student Paper Award].
• A. Kouloumpris, T. Theocharides and M. K. Michael, “Cost-Effective Time-Redundancy based Optimal Task Allocation for the Edge-Hub-Cloud Systems”, IEEE International Symposium on VLSI July 2020 (ISVLSI), Limassol, Cyprus, pp. 368-373.
• S. Falas, C. Konstantinou, M. K. Michael, “A Hardware-based Framework for Secure Firmware Updates on Embedded Systems”, IFIP/IEEE International Conference on Very Large Scale Integration (VLSISoC), October 2019, Cusco, Perou, pp. 1-6.
• A. Kouloumpris, M. K. Michael, T. Theocharides, “Reliability-Aware Task Allocation Latency Optimization in Edge Computing”, IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), July 2019, Rhodes, Greece, pp. 1-4.
• A. Kouloumpris, T. Theocharides, M. K. Michael, “Metis: Optimal Task Allocation Framework for the Edge/Hub/Cloud Paradigm”, IEEE International Conference on Omni-Layer Intelligent Systems (COINS), May 2019, Crete, Greece, pp. 128-133.
• G. Tertytchny, N. Nicolaou, M. K. Michael, “Differentiating Attacks and Faults in Energy Aware Smart Home System using Supervised Machine Learning”, IEEE International Conference on Omni-Layer Intelligent Systems (COINS), May 2019, Crete, Greece, pp. 122-127.
• P. M. Reddy, S. Hadjitheophanous, V. Soteriou, P. V. Gratz and M. K. Michael, “Minimal exercise vector generation for reliability improvement“, Proc. of IEEE International On-Line Test Symposium (IOLTS), July 2017, Thessaloniki, Greece, pp. 113-119.
• S. Hadjitheophanous, S. Neophytou and M. K. Michael, “Utilizing shared memory multi-cores to speed-up the ATPG process”, Proc. of 21^st IEEE European Test Conference (ETS), May 2016, pp. 1-6, Amsterdam – The Netherlands [acceptance rate ~20.5%].
• S. Hadjitheophanous, S. Neophytou and M. K. Michael, “Scalable Parallel Fault Simulation for Shared-Memory Multiprocessor Systems”, Proc. of 34^th IEEE VLSI Test Symposium (VTS), pp. 1-6, April 2016, Las Vegas – NV, USA.
• I. Chadjiminas, I. Savva, C. Kyrkou, M. K. Michael and T. Theocharides, “Emulation-Based Hierarchical Fault-Injection Framework for Coarse-to-Fine Vulnerability Analysis of HardwareAccelerated Approximate Algorithms”, ACM/IEEE Proc. of Design Automation and Test in Europe (DATE), March 2016, pp. 830-833, Dresden – Germany.
• I. Chadjiminas, C. Kyrkou, C. Ttofis, T. Theocharides and M. K. Michael, “In-Field Vulnerability Analysis of Hardware-Accelerated Computer Vision Applications”, Proc. of 25^th International Field Programmable Logic (FPL) Conference, to appear, September 2015, London – UK.
• S. Skitsas, C. A. Nicopoulos, and M. K. Michael, “Toward Efficient Check-Pointing and Rollback Under On-Demand SBST in Chip Multi-Processors”, Proc. of IEEE International On-Line Test Symposium (IOLTS), to appear, July 2015, Halkidiki – Greece.
• S. Neophytou and M. K. Michael, “Tackling the Complexity of Exact Path Delay Fault Grading for Path Intensive Circuits”, Proc. of 20^th IEEE European Test Symposium (ETS), to appear, May 2015, Cluj-Napoca-Romania.
• S. Skitsas, C. A. Nicopoulos, and M. K. Michael, “Exploring check-pointing and rollback recovery under selective SBST in Chip Multi- Processors”, Proc. of 4^th MEDIAN Workshop, March 2015, pp. 1- 4, Grenoble-France.
• S. Neophytou and M. K. Michael, “Optimal Variable Ordering in ZBDD-based Path Representations for Directed Acyclic Graphs”, ACM/IEEE Proc. of 32^nd International Computer Design Conference (ICCD), October 2014, pp. 489-492, Seoul – Korea [acceptance rate 34.7%].
• S. Skitsas, C. A. Nicopoulos, and M. K. Michael, “Exploration of System Availability During Software-Based Self-Testing in Many-core Systems Under Test Latency Constraints”, IEEE Proc. of 27^th Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), October 2014, pp. 1-7, Amsterdam – Netherlands [acceptance rate 34%].
• S. Neophytou, S. Hadjitheophanous and M. K. Michael, “On the impact of fault list partitioning in parallel implementations for dynamic test compaction considering multicore systems”, IEEE Proc. of International Design and Test Symposium (IDT), December 2013, pp. 1-6, Marrakesh – Morocco.
• I. Voyiatzis, S. Neophytou, M. K. Michael, S. Hadjitheophanous, C. Sgouropoulou, and C. Efstathiou, “Test set Embedding in Accumulator-generated sequences targeting Hard-To-detect faults”, IEEE Proc. of International Design and Test Symposium (IDT), December 2013, pp. 1-2, Marrakesh – Morocco.
• M. Skitsas, C. A. Nicopoulos, and M. K. Michael, “DaemonGuard: O/S-assisted selective software-based Self-Testing for multi-core systems”, IEEE Proc. of Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS), October 2013, pp. 45-51, New York City – USA.
• M. Maniatakos, M. K. Michael, and Y. Makris, “Investigating the limits of AVF analysis in the presence of multiple bit errors”, IEEE Proc. of International On-Line Test Symposium (IOLTS), July 2013, pp. 49-54, Crete – Greece.
• M. Maniatakos, M. K. Michael, and Y. Makris, “AVF-Driven Parity Optimization for MBU Protection of In-core Memory Arrays”, ACM/IEEE Proc. of Design Automation and Test in Europe (DATE), March 2013, pp. 1480-1485, Grenoble – France [acceptance rate 16.4%].
• M. Maniatakos, M. K. Michael, and Y. Makris, “Vulnerability-Based Interleaving for Multi-Bit Upset (MBU) Protection in Modern Microprocessors”, IEEE Proc. of International Test Conference (ITC), November 2012, pp. 1-8, California – USA.
• M. Skitsas, C. A. Nicopoulos, and M. K. Michael, “Toward Selective Software-Based Self-Testing in Future Multi-core Microprocessors”, Proc. of 1^st MEDIAN Workshop, June 2012, pp. 71-75, Annecy – France.
• S. Neophytou, C. Christou, and M. K. Michael, “An Approach for Quantifying Path Correlation in Digital Circuits without any Path or Segment Enumeration”, Proc. of IEEE European Test Symposium (ETS), May 2011, pp. 141-146, Trondheim-Norway [acceptance rate 29%].
• A. Papadopoulos, T. Theocharides and M.K. Michael, “Towards optimal CMOS lifetime via unified reliability modeling and multi-objective optimization“, Proc. of IEEE International Symposium on Circuits And Systems (ISCAS), May 2011, pp. 1-4, Brazil.
• C. Ttofis, A. Papadopoulos, T. Theocharides, M. K. Michael and D. Doumenis, “A Reconfigurable MPSoC-based QAM Modulation Architecture”, Proc. of 18^th IEEE VLSI-SoC Conference (VLSI-SoC), October 2010, pp. 137-142, Madrid – Spain [acceptance rate ~40%].
• K. Christou, M. K. Michael, S. Neophytou, “Identification of Critical Primitive Path Delay Faults without and Path Enumeration”, Proc. of 28th IEEE VLSI Test Symposium (VTS), April 2010, pp. 9-14, Santa Cruz, CA – USA.
• C. Ttofis, C. Kyrkou, T. Theocharides, M.K. Michael, “FPGA-Based NoC-Driven Sequence of Lab Assignments for Manycore Systems”, Proc. of IEEE Microelectronics Systems in Education Conference (MSE), July 2009, California – USA [acceptance rate ~35%] [recipient of Best Paper Award].
• S. Neophytou, M. K. Michael, K. Christou, “Generating Diverse Test Sets for Multiple Fault Detections Based on Fault Cone Partitioning”, Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), October 2009, pp. 401-409, Chicago – USA.
• T. Theocharides, M. K. Michael, M. Polycarpou, A. Dingankar, “Towards embedded runtime system level optimization for MPSoCs: on-chip task allocation”, Proc. of ACM/IEEE Great Lakes VLSI Symposium (GLSVLSI), May 2009, pp. 121-124, Boston – USA [long paper acceptance rate 16%].
• P. Bernardi, K. Christou, M. Grosso, M. K. Michael, E. Sanchez, M. Sonza Reorda, “Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors”, Proc. of Applications of Evolutionary Computing: EvoHOT, Lecture Notes in Computer Science, Springer 2008, Volume 4974/2008, 224-234, March 2008, Naples – Italy.
• T. Theocharides, M. K. Michael, M. Polycarpou, and A. Dingankar, “Dynamic System Level Optimization in MultiCore Architectures: The Example of Hardware Task Allocation”, 6th HiPEAC Industrial Workshop, November, 2008, pp. 1-6, Paris – France.
• K. Christou, M. K. Michael, P. Bernardi, M. Grosso, E. Sanchez, M. Sonza Reorda, “A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm”, Proc. of 26th IEEΕ VLSI Test Symposium (VTS), May 2008,pp. 389-394, San Diego, CA – USA.
• S. Neophytou and M. K. Michael, “On the Relaxation of N-detect Test Sets”, Proc. of 26th IEEE VLSI Test Symposium (VTS), May 2008, pp. 187-192, San Diego-CA, USA.
• T. Theocharides, M. K. Michael, M. Polycarpou, and A. Dingankar, “A Novel System-Level On-Chip Resource Allocation Method for Manycore Architectures”, Proc. of IEEE Annual Symposium on VLSI (ISVLSI), April 2008, pp. 99-104, Montpellier – France [acceptance rate 30%].
• S. Neophytou and M. K. Michael, “Two New Methods for Accurate Test Set Relaxation via Test Set Replacement”, Proc. of IEEE/ACM International Symposium on Quality Electronic Design (ISQED), March 2008, pp. 827-831, San Jose, CA – USA.
• S. Neophytou and M. K. Michael, “Hierarchical Fault Compatibility Identification for Compact Test Generation with a Large Number of Unspecified Bits”, Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), September 2007, pp. 439-447, Rome – Italy.
• R. Adapa, S. Tragoudas and M. K. Michael, “Accelerating Diagnosis via Dominance Relations Between Sets of Faults”, Proc. of IEEE VLSI Test Symposium (VTS), May 2007, pp. 219-224, Berkeley, CA – USA.
• K. Christou, M. K. Michael and S. Tragoudas, “Implicit Critical PDF Test Generation with Maximal Test Efficiency”, Proc. of IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), October 2006, pp. 50-58, Washington-DC – USA.
• S. Neophytou, M. K. Michael and S. Tragoudas, “Efficient Deterministic Test Generation for BIST Schemes with LFSR Reseeding”, Proc. of IEEE International On-Line Testing Symposium (IOLTS), July 2006, pp. 43-48, Como – Italy.
• R. Adapa, S. Tragoudas and M. K. Michael, “Sub-Faults Identification for Collapsing in Diagnosis”, Proc. of IEEE International Symposium on Circuits And Systems (ISCAS), May 2006, pp. 815-818, Kos – Greece [acceptance rate 35%].
• R. Adapa, S. Tragoudas and M. K. Michael, “Evaluation of Collapsing Methods for Fault Diagnosis”, Proc. of IEEE/ACM International Symposium on Quality Electronic Design (ISQED), March 2006, pp. 439-444, San Jose, CA – USA [acceptance rate 36.3%].
• M. K. Michael, K. Christou, and S. Tragoudas, “Towards finding path delay fault tests with high test efficiency using ZBDDs”, IEEE/ACM Proc. of International Conference on Computer Design (ICCD), Oct. 2005, pp. 464-467, San Jose, CA – USA [acceptance rate 23%].
• S. Neophytou, M. K. Michael and S. Tragoudas, “Test set enhancement for quality transition faults using function-based methods”, Proc. of IEEE/ACM Great Lakes Symposium on VLSI (GLSVLSI), April 2005, pp. 182-187, Chicago, IL – USA [long paper acceptance rate ~9%].
• M. K. Michael, S. Neophytou, and S. Tragoudas, “Functions for Quality Transition Fault Tests”, Proc. of IEEE/ACM International Symposium on Quality Electronic Design (ISQED), March 2005, pp. 327-332, San Jose, CA – USA [acceptance rate 37.3%] [Best Paper Award Nomination].
• M. K. Michael and S. Tragoudas, “Compact Test Generation for Non-Robustly Testable PDFs”, Proc. of Circuits and Systems, July 2004, pp. 1262-1269, Athens – Greece.41.
• M. K. Michael and S. Tragoudas, “Generation of Hazard Identification Functions”, Proc. of IEEE/ACM International Symposium on Quality Electronic Design (ISQED), March 2003, pp. 511-516, San Jose, CA – USA [acceptance rate 32.8%].
• S. Padmanaban, M. K. Michael, and S. Tragoudas, “Exact Path Delay Grading with Fundamental BDD operations”, Proc. of IEEE International Test Conference (ITC), October 2001, pp. 642-651, Baltimore, MD – USA.
• M. K. Michael and S. Tragoudas, “ATPG for Path Delay Faults without Path Enumeration”, Proc. of IEEE/ACM International Symposium on Quality Electronic Design (ISQED), March 2001, pp. 384-389, San Jose, CA – USA.
• M. K. Michael and S. Tragoudas, “Functional-based ATPG for Path Delay Faults”, Proc. of Southwest Symposium on Mixed-Signal Design, April 2000, pp. 159-164, Arizona – USA [invited paper].
• M. K. Michael and S. Tragoudas, “A Method for Path Delay Fault ATPG in Embedded Cores”, Proc. of IEEE Workshop on Testing Embedded Core-based Systems, April 1999, pp. 50-55, California – USA.
• S. Tragoudas and M. K. Michael, “Functional ATPG for Delay Faults”, Proc. of ACM/IEEE Great Lakes Symposium on VLSI (GLSVLSI), March 1999, pp. 16-19, Ann Arbor, MI – USA.
• S. Tragoudas and M. K. Michael, “ATPG tools for Delay Faults at the Functional Level”, ACM/IEEE Proc. of Design Automation and Test in Europe (DATE), March 1999, pp. 631-635, Munich – Germany.

Theses and Dissertations

• M. K. Michael, Test-based Timing Verification using Functional Techniques, Ph.D. Dissertation, Electrical and Computer Engineering Department, Southern Illinois University at Carbondale, 2002. [Nominated for Best Ph.D. Dissertation of the Year Award at SIU-C by College of Engineering].
• M. K. Michael, Test Pattern Generation for Delay Faults at the Functional Level, M.Sc. Thesis, Computer Science Department, Southern Illinois University at Carbondale, 1998.

Outreach Articles

• M. K. Michael, “Encouraging Young Women Toward Engineering and Applied Sciences: ISIC/MED Special Pro-conference Workshop”,Article appeared in IEEE Control Systems Magazine, April 2006.
• M. K. Michael, “Texnopleysi – The 1st National Robotics Competition in Cyprus”, Article appeared in Phileleftheros and Simerini newspapers, as well as in Koinotita, University of Cyprus Publication, June 2006.