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5th Test Spring School

The 5th edition of the 3-day Test Spring School (TSS@ETS17) for Ph.D and M.Sc students will take place during May 19-22, 2017 at the Classic Hotel, Nicosia. The school is a yearly European event and is held in conjunction to the IEEE European Test Symposium, which will take place following TSS at Limassol, between May 22-26, 2017. Both events are organized by the KIOS Research and Innovation Center of Excellence. The School is also associated with the German DFG priority program SPP1500: “Dependable Embedded Systems”.

TSS@ETS17 offers the unique opportunity to learn about the leading edge of the state-of-the-art in modern test technologies in a comprehensive and compact way. The school will give the opportunity to earn credits and a certificate by passing an exam online. The school is open for registered students at an extremely low fee and welcomes also industrial professionals at a higher rate. Lectures for this year will focus on the topic of “ Machine Learning for Test, Dependability and Fault Tolerance ” and the program at a glance includes the following sub-topics:

“Fundamental Machine Learning Techniques” by Prof. Marios Polycarpou (University of Cyprus)

“Wafer Level Screening Techniques” by Dr. John Carulli (GLOBALFOUNDARIES)

“Circuit and Gate Level Learning Techniques” by Prof. Mehdi Tahoori (Karlsruhe Institute of Technology)

“Applications of Machine Learning in the Design of Reliable and Trusted Analog/RF ICs” by Prof. Yiorgos Makris (UT Dallas)

“Machine Learning Techniques for System Level Test and Diagnosis” by Prof. Krishnendu Chakrabarty (Duke University)

“Self-Awareness and resilience against faults, bugs and attacks” by Prof. Axel Jantsch (TU Wien)

For more information you can visit the School’s webpage.